Reseeding-Oriented Test Power Reduction for Linear-Decompression-Based Test Compression Architectures.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/ieicet/ChenSYLWW16
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Reseeding-Oriented Test Power Reduction for Linear-Decompression-Based Test Compression Architectures.
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Reseeding-Oriented Test Power Reduction for Linear-Decompression-Based Test Compression Architectures.
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