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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/ieicet/FuruyaYS95>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kiyoshi_Furuya>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masayuki_Sato>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Susumu_Yamazaki>
foaf:homepage <http://search.ieice.org/bin/summary.php?id=e78-d_7_889>
dc:identifier DBLP journals/ieicet/FuruyaYS95 (xsd:string)
dcterms:issued 1995 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/ieicet>
rdfs:label Stuck-Open Fault Detectabilities of Various TPG Circuits for Use in Two-Pattern Testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kiyoshi_Furuya>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masayuki_Sato>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Susumu_Yamazaki>
swrc:number 7 (xsd:string)
swrc:pages 889-894 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/ieicet/FuruyaYS95/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/ieicet/FuruyaYS95>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/ieicet/ieicet78d.html#FuruyaYS95>
rdfs:seeAlso <http://search.ieice.org/bin/summary.php?id=e78-d_7_889>
dc:title Stuck-Open Fault Detectabilities of Various TPG Circuits for Use in Two-Pattern Testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 78-D (xsd:string)