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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/ieicet/HiramotoKSM13>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anil_Kumar>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shinji_Miyano>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takuya_Saraya>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Toshiro_Hiramoto>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1587%2Ftransele.E96.C.759>
foaf:homepage <https://doi.org/10.1587/transele.E96.C.759>
dc:identifier DBLP journals/ieicet/HiramotoKSM13 (xsd:string)
dc:identifier DOI doi.org%2F10.1587%2Ftransele.E96.C.759 (xsd:string)
dcterms:issued 2013 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/ieicet>
rdfs:label Experimental Demonstration of Post-Fabrication Self-Improvement of SRAM Cell Stability by High-Voltage Stress. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anil_Kumar>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shinji_Miyano>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takuya_Saraya>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Toshiro_Hiramoto>
swrc:number 6 (xsd:string)
swrc:pages 759-765 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/ieicet/HiramotoKSM13/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/ieicet/HiramotoKSM13>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/ieicet/ieicet96c.html#HiramotoKSM13>
rdfs:seeAlso <https://doi.org/10.1587/transele.E96.C.759>
dc:title Experimental Demonstration of Post-Fabrication Self-Improvement of SRAM Cell Stability by High-Voltage Stress. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 96-C (xsd:string)