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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/ieicet/HuangYZLWZ09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fa-Xin_Yu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hao_Luo_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ping-Hui_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shu-Ting_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yao_Zheng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zheng-Liang_Huang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1587%2Ftransfun.E92.A.2376>
foaf:homepage <https://doi.org/10.1587/transfun.E92.A.2376>
dc:identifier DBLP journals/ieicet/HuangYZLWZ09 (xsd:string)
dc:identifier DOI doi.org%2F10.1587%2Ftransfun.E92.A.2376 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/ieicet>
rdfs:label Empirical-Statistics Analysis for Zero-Failure GaAs MMICs Life Testing Data. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fa-Xin_Yu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hao_Luo_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ping-Hui_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shu-Ting_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yao_Zheng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zheng-Liang_Huang>
swrc:number 9 (xsd:string)
swrc:pages 2376-2379 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/ieicet/HuangYZLWZ09/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/ieicet/HuangYZLWZ09>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/ieicet/ieicet92a.html#HuangYZLWZ09>
rdfs:seeAlso <https://doi.org/10.1587/transfun.E92.A.2376>
dc:title Empirical-Statistics Analysis for Zero-Failure GaAs MMICs Life Testing Data. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 92-A (xsd:string)