Empirical-Statistics Analysis for Zero-Failure GaAs MMICs Life Testing Data.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/ieicet/HuangYZLWZ09
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/ieicet/HuangYZLWZ09
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Fa-Xin_Yu
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hao_Luo_0001
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Ping-Hui_Wang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Shu-Ting_Zhang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Yao_Zheng
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Zheng-Liang_Huang
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1587%2Ftransfun.E92.A.2376
>
foaf:
homepage
<
https://doi.org/10.1587/transfun.E92.A.2376
>
dc:
identifier
DBLP journals/ieicet/HuangYZLWZ09
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1587%2Ftransfun.E92.A.2376
(xsd:string)
dcterms:
issued
2009
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/ieicet
>
rdfs:
label
Empirical-Statistics Analysis for Zero-Failure GaAs MMICs Life Testing Data.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Fa-Xin_Yu
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hao_Luo_0001
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Ping-Hui_Wang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Shu-Ting_Zhang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Yao_Zheng
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Zheng-Liang_Huang
>
swrc:
number
9
(xsd:string)
swrc:
pages
2376-2379
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/ieicet/HuangYZLWZ09/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/ieicet/HuangYZLWZ09
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/ieicet/ieicet92a.html#HuangYZLWZ09
>
rdfs:
seeAlso
<
https://doi.org/10.1587/transfun.E92.A.2376
>
dc:
title
Empirical-Statistics Analysis for Zero-Failure GaAs MMICs Life Testing Data.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
92-A
(xsd:string)