[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/ieicet/ImamotoSE11>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takeshi_Sasaki>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takuya_Imamoto>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tetsuo_Endoh>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1587%2Ftransele.E94.C.724>
foaf:homepage <https://doi.org/10.1587/transele.E94.C.724>
dc:identifier DBLP journals/ieicet/ImamotoSE11 (xsd:string)
dc:identifier DOI doi.org%2F10.1587%2Ftransele.E94.C.724 (xsd:string)
dcterms:issued 2011 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/ieicet>
rdfs:label Evaluation of 1/f Noise Characteristics in High-k/Metal Gate and SiON/Poly-Si Gate MOSFET with 65 nm CMOS Process. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takeshi_Sasaki>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takuya_Imamoto>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tetsuo_Endoh>
swrc:number 5 (xsd:string)
swrc:pages 724-729 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/ieicet/ImamotoSE11/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/ieicet/ImamotoSE11>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/ieicet/ieicet94c.html#ImamotoSE11>
rdfs:seeAlso <https://doi.org/10.1587/transele.E94.C.724>
dc:title Evaluation of 1/f Noise Characteristics in High-k/Metal Gate and SiON/Poly-Si Gate MOSFET with 65 nm CMOS Process. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 94-C (xsd:string)