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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/ieicet/ItoZKK10>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Koji_Kotani>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shin-Ichiro_Kuroki>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takashi_Ito>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaoli_Zhu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1587%2Ftransele.E93.C.1638>
foaf:homepage <https://doi.org/10.1587/transele.E93.C.1638>
dc:identifier DBLP journals/ieicet/ItoZKK10 (xsd:string)
dc:identifier DOI doi.org%2F10.1587%2Ftransele.E93.C.1638 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/ieicet>
rdfs:label Highly Reliable and Drivability-Enhanced MOS Transistors with Rounded Nanograting Channels. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Koji_Kotani>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shin-Ichiro_Kuroki>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takashi_Ito>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaoli_Zhu>
swrc:number 11 (xsd:string)
swrc:pages 1638-1644 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/ieicet/ItoZKK10/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/ieicet/ItoZKK10>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/ieicet/ieicet93c.html#ItoZKK10>
rdfs:seeAlso <https://doi.org/10.1587/transele.E93.C.1638>
dc:title Highly Reliable and Drivability-Enhanced MOS Transistors with Rounded Nanograting Channels. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 93-C (xsd:string)