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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/ieicet/JangKKKHSSCLL13>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Da-Soon_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hi-Deok_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ho-Young_Kwak>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hyuk-Min_Kwon>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jae-Hyung_Jang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jong-Kwan_Shin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Seon-Man_Hwang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Seung-Yong_Sung>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sung-Kyu_Kwon>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yi-Sun_Chung>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1587%2Ftransele.E96.C.624>
foaf:homepage <https://doi.org/10.1587/transele.E96.C.624>
dc:identifier DBLP journals/ieicet/JangKKKHSSCLL13 (xsd:string)
dc:identifier DOI doi.org%2F10.1587%2Ftransele.E96.C.624 (xsd:string)
dcterms:issued 2013 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/ieicet>
rdfs:label Effects of Fluorine Implantation on 1/f Noise, Hot Carrier and NBTI Reliability of MOSFETs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Da-Soon_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hi-Deok_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ho-Young_Kwak>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hyuk-Min_Kwon>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jae-Hyung_Jang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jong-Kwan_Shin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Seon-Man_Hwang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Seung-Yong_Sung>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sung-Kyu_Kwon>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yi-Sun_Chung>
swrc:number 5 (xsd:string)
swrc:pages 624-629 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/ieicet/JangKKKHSSCLL13/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/ieicet/JangKKKHSSCLL13>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/ieicet/ieicet96c.html#JangKKKHSSCLL13>
rdfs:seeAlso <https://doi.org/10.1587/transele.E96.C.624>
dc:title Effects of Fluorine Implantation on 1/f Noise, Hot Carrier and NBTI Reliability of MOSFETs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 96-C (xsd:string)