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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/ieicet/KawashimaFMNNYHE07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Isao_Fukushi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kazuaki_Yamane>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Keizo_Morita>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ken-ichi_Nakabayashi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mitsuharu_Nakazawa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shoichiro_Kawashima>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tomohisa_Hirayama>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Toru_Endo>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1093%2Fietele%2Fe90-c.10.1941>
foaf:homepage <https://doi.org/10.1093/ietele/e90-c.10.1941>
dc:identifier DBLP journals/ieicet/KawashimaFMNNYHE07 (xsd:string)
dc:identifier DOI doi.org%2F10.1093%2Fietele%2Fe90-c.10.1941 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/ieicet>
rdfs:label A Reliable 1T1C FeRAM Using a Thermal History Tracking 2T2C Dual Reference Level Technique for a Smart Card Application Chip. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Isao_Fukushi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kazuaki_Yamane>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Keizo_Morita>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ken-ichi_Nakabayashi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mitsuharu_Nakazawa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shoichiro_Kawashima>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tomohisa_Hirayama>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Toru_Endo>
swrc:number 10 (xsd:string)
swrc:pages 1941-1948 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/ieicet/KawashimaFMNNYHE07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/ieicet/KawashimaFMNNYHE07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/ieicet/ieicet90c.html#KawashimaFMNNYHE07>
rdfs:seeAlso <https://doi.org/10.1093/ietele/e90-c.10.1941>
dc:title A Reliable 1T1C FeRAM Using a Thermal History Tracking 2T2C Dual Reference Level Technique for a Smart Card Application Chip. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 90-C (xsd:string)