[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/ieicet/MatsukiTMAHKA05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kazuyoshi_Torii>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kiyoshi_Hayashi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Naoki_Kasai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takeo_Matsuki>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takeshi_Maeda>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tsunetoshi_Arikado>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yasushi_Akasaka>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1093%2Fietele%2Fe88-c.5.804>
foaf:homepage <https://doi.org/10.1093/ietele/e88-c.5.804>
dc:identifier DBLP journals/ieicet/MatsukiTMAHKA05 (xsd:string)
dc:identifier DOI doi.org%2F10.1093%2Fietele%2Fe88-c.5.804 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/ieicet>
rdfs:label Gate-Last MISFET Structures and Process for Characterization of High-k and Metal Gate MISFETs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kazuyoshi_Torii>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kiyoshi_Hayashi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Naoki_Kasai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takeo_Matsuki>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takeshi_Maeda>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tsunetoshi_Arikado>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yasushi_Akasaka>
swrc:number 5 (xsd:string)
swrc:pages 804-810 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/ieicet/MatsukiTMAHKA05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/ieicet/MatsukiTMAHKA05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/ieicet/ieicet88c.html#MatsukiTMAHKA05>
rdfs:seeAlso <https://doi.org/10.1093/ietele/e88-c.5.804>
dc:title Gate-Last MISFET Structures and Process for Characterization of High-k and Metal Gate MISFETs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 88-C (xsd:string)