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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/ieicet/NikawaINMMN09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Katsuyoshi_Miura>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kiyoshi_Nikawa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Koji_Nakamae>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shoji_Inoue>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tatsuoki_Nagaishi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Toru_Matsumoto_0002>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1587%2Ftransele.E92.C.327>
foaf:homepage <https://doi.org/10.1587/transele.E92.C.327>
dc:identifier DBLP journals/ieicet/NikawaINMMN09 (xsd:string)
dc:identifier DOI doi.org%2F10.1587%2Ftransele.E92.C.327 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/ieicet>
rdfs:label New Approach of Laser-SQUID Microscopy to LSI Failure Analysis. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Katsuyoshi_Miura>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kiyoshi_Nikawa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Koji_Nakamae>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shoji_Inoue>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tatsuoki_Nagaishi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Toru_Matsumoto_0002>
swrc:number 3 (xsd:string)
swrc:pages 327-333 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/ieicet/NikawaINMMN09/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/ieicet/NikawaINMMN09>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/ieicet/ieicet92c.html#NikawaINMMN09>
rdfs:seeAlso <https://doi.org/10.1587/transele.E92.C.327>
dc:title New Approach of Laser-SQUID Microscopy to LSI Failure Analysis. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 92-C (xsd:string)