Layout-Aware Compact Model of MOSFET Characteristics Variations Induced by STI Stress.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/ieicet/YamadaSANMK08
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Layout-Aware Compact Model of MOSFET Characteristics Variations Induced by STI Stress.
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Layout-Aware Compact Model of MOSFET Characteristics Variations Induced by STI Stress.
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