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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/ieicet/YamadaSANMK08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kazuya_Masu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kenta_Yamada>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Noriaki_Nakayama>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shigetaka_Kumashiro>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shuhei_Amakawa>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takashi_Sato>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1093%2Fietele%2Fe91-c.7.1142>
foaf:homepage <https://doi.org/10.1093/ietele/e91-c.7.1142>
dc:identifier DBLP journals/ieicet/YamadaSANMK08 (xsd:string)
dc:identifier DOI doi.org%2F10.1093%2Fietele%2Fe91-c.7.1142 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/ieicet>
rdfs:label Layout-Aware Compact Model of MOSFET Characteristics Variations Induced by STI Stress. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kazuya_Masu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kenta_Yamada>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Noriaki_Nakayama>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shigetaka_Kumashiro>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shuhei_Amakawa>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takashi_Sato>
swrc:number 7 (xsd:string)
swrc:pages 1142-1150 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/ieicet/YamadaSANMK08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/ieicet/YamadaSANMK08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/ieicet/ieicet91c.html#YamadaSANMK08>
rdfs:seeAlso <https://doi.org/10.1093/ietele/e91-c.7.1142>
dc:title Layout-Aware Compact Model of MOSFET Characteristics Variations Induced by STI Stress. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 91-C (xsd:string)