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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/ieicet/YotsuyanagiYH10>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroyuki_Yotsuyanagi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masaki_Hashizume>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masayuki_Yamamoto>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1587%2Ftransinf.E93.D.10>
foaf:homepage <https://doi.org/10.1587/transinf.E93.D.10>
dc:identifier DBLP journals/ieicet/YotsuyanagiYH10 (xsd:string)
dc:identifier DOI doi.org%2F10.1587%2Ftransinf.E93.D.10 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/ieicet>
rdfs:label Scan Chain Ordering to Reduce Test Data for BIST-Aided Scan Test Using Compatible Scan Flip-Flops. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroyuki_Yotsuyanagi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masaki_Hashizume>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masayuki_Yamamoto>
swrc:number 1 (xsd:string)
swrc:pages 10-16 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/ieicet/YotsuyanagiYH10/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/ieicet/YotsuyanagiYH10>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/ieicet/ieicet93d.html#YotsuyanagiYH10>
rdfs:seeAlso <https://doi.org/10.1587/transinf.E93.D.10>
dc:title Scan Chain Ordering to Reduce Test Data for BIST-Aided Scan Test Using Compatible Scan Flip-Flops. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 93-D (xsd:string)