Thermal-Aware Test Access Mechanism and Wrapper Design Optimization for System-on-Chips.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/ieicet/YuYCF08
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Thermal-Aware Test Access Mechanism and Wrapper Design Optimization for System-on-Chips.
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Thermal-Aware Test Access Mechanism and Wrapper Design Optimization for System-on-Chips.
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