Statistical Gate-Delay Modeling with Intra-Gate Variability.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/ieiceta/OkadaYO03
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Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/ieiceta/OkadaYO03
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hidetoshi_Onodera
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Kenichi_Okada
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Kento_Yamaoka
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foaf:
homepage
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http://search.ieice.org/bin/summary.php?id=e86-a_12_2914
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dc:
identifier
DBLP journals/ieiceta/OkadaYO03
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dcterms:
issued
2003
(xsd:gYear)
swrc:
journal
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https://dblp.l3s.de/d2r/resource/journals/ieiceta
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rdfs:
label
Statistical Gate-Delay Modeling with Intra-Gate Variability.
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foaf:
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https://dblp.l3s.de/d2r/resource/authors/Hidetoshi_Onodera
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foaf:
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foaf:
maker
<
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>
swrc:
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12
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swrc:
pages
2914-2922
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owl:
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http://bibsonomy.org/uri/bibtexkey/journals/ieiceta/OkadaYO03/dblp
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owl:
sameAs
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rdfs:
seeAlso
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http://dblp.uni-trier.de/db/journals/ieiceta/ieiceta86.html#OkadaYO03
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rdfs:
seeAlso
<
http://search.ieice.org/bin/summary.php?id=e86-a_12_2914
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dc:
title
Statistical Gate-Delay Modeling with Intra-Gate Variability.
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dc:
type
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86-A
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