RF performance reliability of power N-LDMOS under pulsed-RF aging life test in radar application S-band.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/iet-cds/BelaidAM20
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RF performance reliability of power N-LDMOS under pulsed-RF aging life test in radar application S-band.
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RF performance reliability of power N-LDMOS under pulsed-RF aging life test in radar application S-band.
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