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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/iet-cds/TakeuchiSOSNT18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fumio_Tsuchiya>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kan_Takeuchi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Koji_Nii>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Koji_Shibutani>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masaki_Shimada>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Takeshi_Okagaki>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1049%2Fiet-cds.2017.0153>
foaf:homepage <https://doi.org/10.1049/iet-cds.2017.0153>
dc:identifier DBLP journals/iet-cds/TakeuchiSOSNT18 (xsd:string)
dc:identifier DOI doi.org%2F10.1049%2Fiet-cds.2017.0153 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/iet-cds>
rdfs:label Wear-out stress monitor utilising temperature and voltage sensitive ring oscillators. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fumio_Tsuchiya>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kan_Takeuchi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Koji_Nii>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Koji_Shibutani>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masaki_Shimada>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Takeshi_Okagaki>
swrc:number 2 (xsd:string)
swrc:pages 182-188 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/iet-cds/TakeuchiSOSNT18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/iet-cds/TakeuchiSOSNT18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/iet-cds/iet-cds12.html#TakeuchiSOSNT18>
rdfs:seeAlso <https://doi.org/10.1049/iet-cds.2017.0153>
dc:title Wear-out stress monitor utilising temperature and voltage sensitive ring oscillators. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 12 (xsd:string)