Extending gate-level diagnosis tools to CMOS intra-gate faults.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/iet-cdt/FanMHG07
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/iet-cdt/FanMHG07
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Camelia_Hora
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Guido_Gronthoud
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Will_R._Moore
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Xinyue_Fan
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1049%2Fiet-cdt%3A20060206
>
foaf:
homepage
<
https://doi.org/10.1049/iet-cdt:20060206
>
dc:
identifier
DBLP journals/iet-cdt/FanMHG07
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1049%2Fiet-cdt%3A20060206
(xsd:string)
dcterms:
issued
2007
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/iet-cdt
>
rdfs:
label
Extending gate-level diagnosis tools to CMOS intra-gate faults.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Camelia_Hora
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Guido_Gronthoud
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Will_R._Moore
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Xinyue_Fan
>
swrc:
number
6
(xsd:string)
swrc:
pages
685-693
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/iet-cdt/FanMHG07/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/iet-cdt/FanMHG07
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/iet-cdt/iet-cdt1.html#FanMHG07
>
rdfs:
seeAlso
<
https://doi.org/10.1049/iet-cdt:20060206
>
dc:
title
Extending gate-level diagnosis tools to CMOS intra-gate faults.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
1
(xsd:string)