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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/iet-cdt/FazeliMEP09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ahmad_Patooghy>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alireza_Ejlali>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mahdi_Fazeli>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Seyed_Ghassem_Miremadi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1049%2Fiet-cdt.2008.0099>
foaf:homepage <https://doi.org/10.1049/iet-cdt.2008.0099>
dc:identifier DBLP journals/iet-cdt/FazeliMEP09 (xsd:string)
dc:identifier DOI doi.org%2F10.1049%2Fiet-cdt.2008.0099 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/iet-cdt>
rdfs:label Low energy single event upset/single event transient-tolerant latch for deep subMicron technologies. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ahmad_Patooghy>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alireza_Ejlali>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mahdi_Fazeli>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Seyed_Ghassem_Miremadi>
swrc:number 3 (xsd:string)
swrc:pages 289-303 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/iet-cdt/FazeliMEP09/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/iet-cdt/FazeliMEP09>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/iet-cdt/iet-cdt3.html#FazeliMEP09>
rdfs:seeAlso <https://doi.org/10.1049/iet-cdt.2008.0099>
dc:title Low energy single event upset/single event transient-tolerant latch for deep subMicron technologies. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 3 (xsd:string)