Low energy single event upset/single event transient-tolerant latch for deep subMicron technologies.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/iet-cdt/FazeliMEP09
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2009
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Low energy single event upset/single event transient-tolerant latch for deep subMicron technologies.
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Low energy single event upset/single event transient-tolerant latch for deep subMicron technologies.
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