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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/iet-cdt/YangKPLK07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/D._Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Myung-Hoon_Yang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sungho_Kang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Youbean_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Youngkyu_Park>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1049%2Fiet-cdt%3A20060114>
foaf:homepage <https://doi.org/10.1049/iet-cdt:20060114>
dc:identifier DBLP journals/iet-cdt/YangKPLK07 (xsd:string)
dc:identifier DOI doi.org%2F10.1049%2Fiet-cdt%3A20060114 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/iet-cdt>
rdfs:label Deterministic built-in self-test using split linear feedback shift register reseeding for low-power testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/D._Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Myung-Hoon_Yang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sungho_Kang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Youbean_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Youngkyu_Park>
swrc:number 4 (xsd:string)
swrc:pages 369-376 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/iet-cdt/YangKPLK07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/iet-cdt/YangKPLK07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/iet-cdt/iet-cdt1.html#YangKPLK07>
rdfs:seeAlso <https://doi.org/10.1049/iet-cdt:20060114>
dc:title Deterministic built-in self-test using split linear feedback shift register reseeding for low-power testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 1 (xsd:string)