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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/iet-sen/PandeyRT20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anil_Kumar_Tripathi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Deevashwer_Rathee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sushant_Kumar_Pandey>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1049%2Fiet-sen.2020.0119>
foaf:homepage <https://doi.org/10.1049/iet-sen.2020.0119>
dc:identifier DBLP journals/iet-sen/PandeyRT20 (xsd:string)
dc:identifier DOI doi.org%2F10.1049%2Fiet-sen.2020.0119 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/iet-sen>
rdfs:label Software defect prediction using K-PCA and various kernel-based extreme learning machine: an empirical study. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anil_Kumar_Tripathi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Deevashwer_Rathee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sushant_Kumar_Pandey>
swrc:number 7 (xsd:string)
swrc:pages 768-782 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/iet-sen/PandeyRT20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/iet-sen/PandeyRT20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/iet-sen/iet-sen14.html#PandeyRT20>
rdfs:seeAlso <https://doi.org/10.1049/iet-sen.2020.0119>
dc:title Software defect prediction using K-PCA and various kernel-based extreme learning machine: an empirical study. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 14 (xsd:string)