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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/ijcat/KimLKY10>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hae-Jeong_Yang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hyung_Tae_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kang_Won_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sung-Chul_Kim>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1504%2FIJCAT.2010.034729>
foaf:homepage <https://doi.org/10.1504/IJCAT.2010.034729>
dc:identifier DBLP journals/ijcat/KimLKY10 (xsd:string)
dc:identifier DOI doi.org%2F10.1504%2FIJCAT.2010.034729 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/ijcat>
rdfs:label A precise inspection technique for wafer pre-sawing lines using Affine transformation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hae-Jeong_Yang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hyung_Tae_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kang_Won_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sung-Chul_Kim>
swrc:number 1/2/3 (xsd:string)
swrc:pages 46-52 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/ijcat/KimLKY10/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/ijcat/KimLKY10>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/ijcat/ijcat39.html#KimLKY10>
rdfs:seeAlso <https://doi.org/10.1504/IJCAT.2010.034729>
dc:title A precise inspection technique for wafer pre-sawing lines using Affine transformation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 39 (xsd:string)