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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/ijcse/Saysanasongkham17>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Aromhack_Saysanasongkham>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masayuki_Arai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Satoshi_Fukumoto>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1504%2FIJCSE.2017.10005743>
foaf:homepage <https://doi.org/10.1504/IJCSE.2017.10005743>
dc:identifier DBLP journals/ijcse/Saysanasongkham17 (xsd:string)
dc:identifier DOI doi.org%2F10.1504%2FIJCSE.2017.10005743 (xsd:string)
dcterms:issued 2017 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/ijcse>
rdfs:label Fault masking issue on a dependable processor using BIST under highly electromagnetic environment. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Aromhack_Saysanasongkham>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masayuki_Arai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Satoshi_Fukumoto>
swrc:number 4 (xsd:string)
swrc:pages 309-320 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/ijcse/Saysanasongkham17/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/ijcse/Saysanasongkham17>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/ijcse/ijcse14.html#Saysanasongkham17>
rdfs:seeAlso <https://doi.org/10.1504/IJCSE.2017.10005743>
dc:title Fault masking issue on a dependable processor using BIST under highly electromagnetic environment. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 14 (xsd:string)