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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/ijcta/PanZRYND24>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bao-Lin_Nie>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dan_Ren>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jinsheng_Yang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pingan_Du>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yu_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zeyu_Pan>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1002%2Fcta.3797>
foaf:homepage <https://doi.org/10.1002/cta.3797>
dc:identifier DBLP journals/ijcta/PanZRYND24 (xsd:string)
dc:identifier DOI doi.org%2F10.1002%2Fcta.3797 (xsd:string)
dcterms:issued 2024 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/ijcta>
rdfs:label A bipolar junction transistor EMC modeling method based on physical characteristic measurement and simplex optimization. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bao-Lin_Nie>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dan_Ren>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jinsheng_Yang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pingan_Du>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yu_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zeyu_Pan>
swrc:month February (xsd:string)
swrc:number 2 (xsd:string)
swrc:pages 551-568 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/ijcta/PanZRYND24/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/ijcta/PanZRYND24>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/ijcta/ijcta52.html#PanZRYND24>
rdfs:seeAlso <https://doi.org/10.1002/cta.3797>
dc:title A bipolar junction transistor EMC modeling method based on physical characteristic measurement and simplex optimization. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 52 (xsd:string)