In-situ infrared detection and heating of metallic phase of silicon during scratching test.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/ijmtm/DongPM05
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In-situ infrared detection and heating of metallic phase of silicon during scratching test.
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In-situ infrared detection and heating of metallic phase of silicon during scratching test.
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