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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/ijpr/SiebertBKALNNS18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dima_Nazzal>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/George_L._Nemhauser>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Haejoong_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Joel_Sokol>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Junho_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kelly_Bartlett>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mat%E2%88%9A%E2%89%A0as_Siebert>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shabbir_Ahmed_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1080%2F00207543.2017.1387679>
foaf:homepage <https://doi.org/10.1080/00207543.2017.1387679>
dc:identifier DBLP journals/ijpr/SiebertBKALNNS18 (xsd:string)
dc:identifier DOI doi.org%2F10.1080%2F00207543.2017.1387679 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/ijpr>
rdfs:label Lot targeting and lot dispatching decision policies for semiconductor manufacturing: optimisation under uncertainty with simulation validation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dima_Nazzal>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/George_L._Nemhauser>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Haejoong_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Joel_Sokol>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Junho_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kelly_Bartlett>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mat%E2%88%9A%E2%89%A0as_Siebert>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shabbir_Ahmed_0001>
swrc:number 1-2 (xsd:string)
swrc:pages 629-641 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/ijpr/SiebertBKALNNS18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/ijpr/SiebertBKALNNS18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/ijpr/ijpr56.html#SiebertBKALNNS18>
rdfs:seeAlso <https://doi.org/10.1080/00207543.2017.1387679>
dc:title Lot targeting and lot dispatching decision policies for semiconductor manufacturing: optimisation under uncertainty with simulation validation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 56 (xsd:string)