Wafer delay analysis and control of dual-armed cluster tools with chamber cleaning operations.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/ijpr/YuL20
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/ijpr/YuL20
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Tae-Eog_Lee
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Tae-Sun_Yu
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1080%2F00207543.2019.1593547
>
foaf:
homepage
<
https://doi.org/10.1080/00207543.2019.1593547
>
dc:
identifier
DBLP journals/ijpr/YuL20
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1080%2F00207543.2019.1593547
(xsd:string)
dcterms:
issued
2020
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/ijpr
>
rdfs:
label
Wafer delay analysis and control of dual-armed cluster tools with chamber cleaning operations.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Tae-Eog_Lee
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Tae-Sun_Yu
>
swrc:
number
2
(xsd:string)
swrc:
pages
434-447
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/ijpr/YuL20/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/ijpr/YuL20
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/ijpr/ijpr58.html#YuL20
>
rdfs:
seeAlso
<
https://doi.org/10.1080/00207543.2019.1593547
>
dc:
title
Wafer delay analysis and control of dual-armed cluster tools with chamber cleaning operations.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
58
(xsd:string)