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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/ijra/LinTTCC10>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/C.-C._Chiu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/C.-M._Tseng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/C.-S._Lin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/C.-W._Tsai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/S.-C._Chang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.2316%2FJournal.206.2010.3.206-2987>
foaf:homepage <https://doi.org/10.2316/Journal.206.2010.3.206-2987>
dc:identifier DBLP journals/ijra/LinTTCC10 (xsd:string)
dc:identifier DOI doi.org%2F10.2316%2FJournal.206.2010.3.206-2987 (xsd:string)
dcterms:issued 2010 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/ijra>
rdfs:label Automatic Inspection for etching transistors in TFT-LCD Panel Using Binary Tree Structure and Bintree Searching and Gradient Orientation Code. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/C.-C._Chiu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/C.-M._Tseng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/C.-S._Lin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/C.-W._Tsai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/S.-C._Chang>
swrc:number 3 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/ijra/LinTTCC10/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/ijra/LinTTCC10>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/ijra/ijra25.html#LinTTCC10>
rdfs:seeAlso <https://doi.org/10.2316/Journal.206.2010.3.206-2987>
dc:title Automatic Inspection for etching transistors in TFT-LCD Panel Using Binary Tree Structure and Bintree Searching and Gradient Orientation Code. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 25 (xsd:string)