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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/ijss/AntilaKMHB08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Janne_H%E2%88%9A%C2%A7rk%E2%88%9A%E2%88%82nen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jukka_Antila>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Matti_Mottonen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Pekka_Belt>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Timo_Karhu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1504%2FIJSS.2008.020055>
foaf:homepage <https://doi.org/10.1504/IJSS.2008.020055>
dc:identifier DBLP journals/ijss/AntilaKMHB08 (xsd:string)
dc:identifier DOI doi.org%2F10.1504%2FIJSS.2008.020055 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/ijss>
rdfs:label Reducing test costs in electronics mass-production. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Janne_H%E2%88%9A%C2%A7rk%E2%88%9A%E2%88%82nen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jukka_Antila>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Matti_Mottonen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Pekka_Belt>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Timo_Karhu>
swrc:number 4 (xsd:string)
swrc:pages 393-406 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/ijss/AntilaKMHB08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/ijss/AntilaKMHB08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/ijss/ijss4.html#AntilaKMHB08>
rdfs:seeAlso <https://doi.org/10.1504/IJSS.2008.020055>
dc:title Reducing test costs in electronics mass-production. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 4 (xsd:string)