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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/integration/BerrimaBS18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Safa_Berrima>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yves_Blaqui%E2%88%9A%C2%AEre>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yvon_Savaria>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.vlsi.2018.02.010>
foaf:homepage <https://doi.org/10.1016/j.vlsi.2018.02.010>
dc:identifier DBLP journals/integration/BerrimaBS18 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.vlsi.2018.02.010 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/integration>
rdfs:label Diagnosis algorithms for a reconfigurable and defect tolerant JTAG scan chain in large area integrated circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Safa_Berrima>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yves_Blaqui%E2%88%9A%C2%AEre>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yvon_Savaria>
swrc:pages 159-169 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/integration/BerrimaBS18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/integration/BerrimaBS18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/integration/integration62.html#BerrimaBS18>
rdfs:seeAlso <https://doi.org/10.1016/j.vlsi.2018.02.010>
dc:title Diagnosis algorithms for a reconfigurable and defect tolerant JTAG scan chain in large area integrated circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 62 (xsd:string)