[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/integration/DingCGXG23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Liqiang_Ding>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mali_Gao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ruirui_Xia>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaowu_Cai>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuexin_Gao>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.vlsi.2022.09.011>
foaf:homepage <https://doi.org/10.1016/j.vlsi.2022.09.011>
dc:identifier DBLP journals/integration/DingCGXG23 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.vlsi.2022.09.011 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/integration>
rdfs:label A high reliability under-voltage lock out circuit for power driver IC. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Liqiang_Ding>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mali_Gao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ruirui_Xia>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaowu_Cai>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuexin_Gao>
swrc:pages 166-172 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/integration/DingCGXG23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/integration/DingCGXG23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/integration/integration88.html#DingCGXG23>
rdfs:seeAlso <https://doi.org/10.1016/j.vlsi.2022.09.011>
dc:title A high reliability under-voltage lock out circuit for power driver IC. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 88 (xsd:string)