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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/integration/ZhangZLL23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jizuo_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Qing_Zhang_0008>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yongfu_Li_0002>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuhang_Zhang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1016%2Fj.vlsi.2022.09.001>
foaf:homepage <https://doi.org/10.1016/j.vlsi.2022.09.001>
dc:identifier DBLP journals/integration/ZhangZLL23 (xsd:string)
dc:identifier DOI doi.org%2F10.1016%2Fj.vlsi.2022.09.001 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/integration>
rdfs:label Corrigendum to "WDP-BNN: Efficient wafer defect pattern classification via binarized neural network" [Integration 85 (2022) 76-86]. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jizuo_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Qing_Zhang_0008>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yongfu_Li_0002>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuhang_Zhang>
swrc:pages 10 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/integration/ZhangZLL23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/integration/ZhangZLL23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/integration/integration88.html#ZhangZLL23>
rdfs:seeAlso <https://doi.org/10.1016/j.vlsi.2022.09.001>
dc:title Corrigendum to "WDP-BNN: Efficient wafer defect pattern classification via binarized neural network" [Integration 85 (2022) 76-86]. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 88 (xsd:string)