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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/it/Grosspietsch88>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Karl-Erwin_Gro%E2%88%9A%C3%BCpietsch>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1524%2Fitit.1988.30.4.247>
foaf:homepage <https://doi.org/10.1524/itit.1988.30.4.247>
dc:identifier DBLP journals/it/Grosspietsch88 (xsd:string)
dc:identifier DOI doi.org%2F10.1524%2Fitit.1988.30.4.247 (xsd:string)
dcterms:issued 1988 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/it>
rdfs:label Testfreundlichkeit und Fehlertoleranz in VLSI-Systemen / Testability and Fault Tolerance in VLSI-Systems. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Karl-Erwin_Gro%E2%88%9A%C3%BCpietsch>
swrc:number 4 (xsd:string)
swrc:pages 247-253 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/it/Grosspietsch88/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/it/Grosspietsch88>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/it/it30.html#Grosspietsch88>
rdfs:seeAlso <https://doi.org/10.1524/itit.1988.30.4.247>
dc:title Testfreundlichkeit und Fehlertoleranz in VLSI-Systemen / Testability and Fault Tolerance in VLSI-Systems. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 30 (xsd:string)