Robust inference for destructive one-shot device test data under Weibull lifetimes and competing risks.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/jcam/BalakrishnanC24
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Robust inference for destructive one-shot device test data under Weibull lifetimes and competing risks.
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Robust inference for destructive one-shot device test data under Weibull lifetimes and competing risks.
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