Investigation of Intermittent Resistive Faults in Digital CMOS Circuits.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/jcsc/KerkhoffE16
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/jcsc/KerkhoffE16
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hans_G._Kerkhoff
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hassan_Ebrahimi
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1142%2FS0218126616400235
>
foaf:
homepage
<
https://doi.org/10.1142/S0218126616400235
>
dc:
identifier
DBLP journals/jcsc/KerkhoffE16
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1142%2FS0218126616400235
(xsd:string)
dcterms:
issued
2016
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/jcsc
>
rdfs:
label
Investigation of Intermittent Resistive Faults in Digital CMOS Circuits.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hans_G._Kerkhoff
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hassan_Ebrahimi
>
swrc:
number
3
(xsd:string)
swrc:
pages
1640023:1-1640023:17
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/jcsc/KerkhoffE16/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/jcsc/KerkhoffE16
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/jcsc/jcsc25.html#KerkhoffE16
>
rdfs:
seeAlso
<
https://doi.org/10.1142/S0218126616400235
>
dc:
title
Investigation of Intermittent Resistive Faults in Digital CMOS Circuits.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
25
(xsd:string)