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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/jcsc/MolinarSolisSFHP24>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Daniel_Fajardo-Delgado>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Daniel_Sanchez-Arias>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ivan_R._Padilla-Cantoya>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jesus_E._Molinar-Solis>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Juan_Jes%E2%88%9A%C4%BCs_Ocampo_Hidalgo>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1142%2FS0218126624500683>
foaf:homepage <https://doi.org/10.1142/S0218126624500683>
dc:identifier DBLP journals/jcsc/MolinarSolisSFHP24 (xsd:string)
dc:identifier DOI doi.org%2F10.1142%2FS0218126624500683 (xsd:string)
dcterms:issued 2024 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/jcsc>
rdfs:label Electrical Characterization of the Clamping Behavior on CMOS Quasi-Floating-Gate Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Daniel_Fajardo-Delgado>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Daniel_Sanchez-Arias>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ivan_R._Padilla-Cantoya>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jesus_E._Molinar-Solis>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Juan_Jes%E2%88%9A%C4%BCs_Ocampo_Hidalgo>
swrc:month March (xsd:string)
swrc:number 4 (xsd:string)
swrc:pages 2450068:1-2450068:17 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/jcsc/MolinarSolisSFHP24/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/jcsc/MolinarSolisSFHP24>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/jcsc/jcsc33.html#MolinarSolisSFHP24>
rdfs:seeAlso <https://doi.org/10.1142/S0218126624500683>
dc:title Electrical Characterization of the Clamping Behavior on CMOS Quasi-Floating-Gate Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 33 (xsd:string)