Mixed-Voltage I/O Buffer Using NMOS Blocking Considering Gate Oxide Reliability.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/jcsc/NedalgiS22
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/jcsc/NedalgiS22
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Dharmaray_Nedalgi
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Saroja_V._Siddamal
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1142%2FS0218126622502024
>
foaf:
homepage
<
https://doi.org/10.1142/S0218126622502024
>
dc:
identifier
DBLP journals/jcsc/NedalgiS22
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1142%2FS0218126622502024
(xsd:string)
dcterms:
issued
2022
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/jcsc
>
rdfs:
label
Mixed-Voltage I/O Buffer Using NMOS Blocking Considering Gate Oxide Reliability.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Dharmaray_Nedalgi
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Saroja_V._Siddamal
>
swrc:
number
11
(xsd:string)
swrc:
pages
2250202:1-2250202:13
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/jcsc/NedalgiS22/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/jcsc/NedalgiS22
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/jcsc/jcsc31.html#NedalgiS22
>
rdfs:
seeAlso
<
https://doi.org/10.1142/S0218126622502024
>
dc:
title
Mixed-Voltage I/O Buffer Using NMOS Blocking Considering Gate Oxide Reliability.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
31
(xsd:string)