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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/jcsc/NigamTB23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kaushal_Nigam>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mukesh_Kumar_Bind>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vinay_Anand_Tikkiwal>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1142%2FS0218126623502523>
foaf:homepage <https://doi.org/10.1142/S0218126623502523>
dc:identifier DBLP journals/jcsc/NigamTB23 (xsd:string)
dc:identifier DOI doi.org%2F10.1142%2FS0218126623502523 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/jcsc>
rdfs:label Theoretical Investigation of Dual-Material Stacked Gate Oxide-Source Dielectric Pocket TFET Based on Interface Trap Charges and Temperature Variations. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kaushal_Nigam>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mukesh_Kumar_Bind>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vinay_Anand_Tikkiwal>
swrc:month October (xsd:string)
swrc:number 15 (xsd:string)
swrc:pages 2350252:1-2350252:31 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/jcsc/NigamTB23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/jcsc/NigamTB23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/jcsc/jcsc32.html#NigamTB23>
rdfs:seeAlso <https://doi.org/10.1142/S0218126623502523>
dc:title Theoretical Investigation of Dual-Material Stacked Gate Oxide-Source Dielectric Pocket TFET Based on Interface Trap Charges and Temperature Variations. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 32 (xsd:string)