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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/jcst/HanLLC05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Anshuman_Chandra>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Huawei_Li_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaowei_Li_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yinhe_Han_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs11390-005-0201-3>
foaf:homepage <https://doi.org/10.1007/s11390-005-0201-3>
dc:identifier DBLP journals/jcst/HanLLC05 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs11390-005-0201-3 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/jcst>
rdfs:label Test Resource Partitioning Based on Efficient Response Compaction for Test Time and Tester Channels Reduction. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Anshuman_Chandra>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Huawei_Li_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaowei_Li_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yinhe_Han_0001>
swrc:number 2 (xsd:string)
swrc:pages 201-209 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/jcst/HanLLC05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/jcst/HanLLC05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/jcst/jcst20.html#HanLLC05>
rdfs:seeAlso <https://doi.org/10.1007/s11390-005-0201-3>
dc:subject System-on-a-Chip (SoC); test resource partitioning (TRP); response compaction; diagnose; error cancellation (xsd:string)
dc:title Test Resource Partitioning Based on Efficient Response Compaction for Test Time and Tester Channels Reduction. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 20 (xsd:string)