Analysis of Software Test Item Generation - Comparison Between High Skilled and Low Skilled Engineers.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/jcst/HirayamaMK05
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/jcst/HirayamaMK05
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Masayuki_Hirayama
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Osamu_Mizuno
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Tohru_Kikuno
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1007%2Fs11390-005-0250-7
>
foaf:
homepage
<
https://doi.org/10.1007/s11390-005-0250-7
>
dc:
identifier
DBLP journals/jcst/HirayamaMK05
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1007%2Fs11390-005-0250-7
(xsd:string)
dcterms:
issued
2005
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/jcst
>
rdfs:
label
Analysis of Software Test Item Generation - Comparison Between High Skilled and Low Skilled Engineers.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Masayuki_Hirayama
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Osamu_Mizuno
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Tohru_Kikuno
>
swrc:
number
2
(xsd:string)
swrc:
pages
250-257
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/jcst/HirayamaMK05/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/jcst/HirayamaMK05
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/jcst/jcst20.html#HirayamaMK05
>
rdfs:
seeAlso
<
https://doi.org/10.1007/s11390-005-0250-7
>
dc:
subject
software testing; deviation analysis; engineers skill
(xsd:string)
dc:
title
Analysis of Software Test Item Generation - Comparison Between High Skilled and Low Skilled Engineers.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
20
(xsd:string)