Low Cost Scan Test by Test Correlation Utilization. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

Property	Value
dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/journals/jcst/Sinanoglu07>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Ozgur_Sinanoglu>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1007%2Fs11390-007-9089-4>
foaf:homepage	<https://doi.org/10.1007/s11390-007-9089-4>
dc:identifier	DBLP journals/jcst/Sinanoglu07 (xsd:string)
dc:identifier	DOI doi.org%2F10.1007%2Fs11390-007-9089-4 (xsd:string)
dcterms:issued	2007 (xsd:gYear)
swrc:journal	<https://dblp.l3s.de/d2r/resource/journals/jcst>
rdfs:label	Low Cost Scan Test by Test Correlation Utilization. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Ozgur_Sinanoglu>
swrc:number	5 (xsd:string)
swrc:pages	681-694 (xsd:string)
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/journals/jcst/Sinanoglu07/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/journals/jcst/Sinanoglu07>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/journals/jcst/jcst22.html#Sinanoglu07>
rdfs:seeAlso	<https://doi.org/10.1007/s11390-007-9089-4>
dc:subject	scan-based testing; test data compression; test correlation; scan architecture design (xsd:string)
dc:title	Low Cost Scan Test by Test Correlation Utilization. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:Article
rdf:type	foaf:Document
swrc:volume	22 (xsd:string)