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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/jcst/WangHHLZ07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wei_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiaowei_Li_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yinhe_Han_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/You-Sheng_Zhang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yu_Hu_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs11390-007-9091-x>
foaf:homepage <https://doi.org/10.1007/s11390-007-9091-x>
dc:identifier DBLP journals/jcst/WangHHLZ07 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs11390-007-9091-x (xsd:string)
dcterms:issued 2007 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/jcst>
rdfs:label Leakage Current Optimization Techniques During Test Based on Don't Care Bits Assignment. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wei_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiaowei_Li_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yinhe_Han_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/You-Sheng_Zhang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yu_Hu_0001>
swrc:number 5 (xsd:string)
swrc:pages 673-680 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/jcst/WangHHLZ07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/jcst/WangHHLZ07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/jcst/jcst22.html#WangHHLZ07>
rdfs:seeAlso <https://doi.org/10.1007/s11390-007-9091-x>
dc:subject leakage current; don’t care bits; minimum leakage vector; leakage power (xsd:string)
dc:title Leakage Current Optimization Techniques During Test Based on Don't Care Bits Assignment. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 22 (xsd:string)