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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/jcst/WangXCX23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jia-Cheng_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jie_Xiao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rong-Chen_Xu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zhen_Wang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs11390-023-2554-x>
foaf:homepage <https://doi.org/10.1007/s11390-023-2554-x>
dc:identifier DBLP journals/jcst/WangXCX23 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs11390-023-2554-x (xsd:string)
dcterms:issued 2023 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/jcst>
rdfs:label A Survey of Reliability Issues Related to Approximate Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jia-Cheng_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jie_Xiao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rong-Chen_Xu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zhen_Wang>
swrc:month April (xsd:string)
swrc:number 2 (xsd:string)
swrc:pages 273-288 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/jcst/WangXCX23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/jcst/WangXCX23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/jcst/jcst38.html#WangXCX23>
rdfs:seeAlso <https://doi.org/10.1007/s11390-023-2554-x>
dc:title A Survey of Reliability Issues Related to Approximate Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 38 (xsd:string)