Defects, Fault Modeling, and Test Development Framework for RRAMs.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/jetc/FiebackMWABTH22
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/journals/jetc/FiebackMWABTH22
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Guilherme_Cardoso_Medeiros
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Hassen_Aziza
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Lizhou_Wu
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Moritz_Fieback
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Mottaqiallah_Taouil
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Rajendra_Bishnoi
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1145%2F3510851
>
foaf:
homepage
<
https://doi.org/10.1145/3510851
>
dc:
identifier
DBLP journals/jetc/FiebackMWABTH22
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1145%2F3510851
(xsd:string)
dcterms:
issued
2022
(xsd:gYear)
swrc:
journal
<
https://dblp.l3s.de/d2r/resource/journals/jetc
>
rdfs:
label
Defects, Fault Modeling, and Test Development Framework for RRAMs.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Guilherme_Cardoso_Medeiros
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Hassen_Aziza
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Lizhou_Wu
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Moritz_Fieback
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Mottaqiallah_Taouil
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Rajendra_Bishnoi
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui
>
swrc:
number
3
(xsd:string)
swrc:
pages
52:1-52:26
(xsd:string)
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/journals/jetc/FiebackMWABTH22/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/journals/jetc/FiebackMWABTH22
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/journals/jetc/jetc18.html#FiebackMWABTH22
>
rdfs:
seeAlso
<
https://doi.org/10.1145/3510851
>
dc:
title
Defects, Fault Modeling, and Test Development Framework for RRAMs.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:Article
rdf:
type
foaf:Document
swrc:
volume
18
(xsd:string)