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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/jetc/ForeroCR23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Freddy_Forero>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michel_Renovell>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/V%E2%88%9A%E2%89%A0ctor_H._Champac>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F3564244>
foaf:homepage <https://doi.org/10.1145/3564244>
dc:identifier DBLP journals/jetc/ForeroCR23 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F3564244 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/jetc>
rdfs:label B-open Defect: A Novel Defect Model in FinFET Technology. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Freddy_Forero>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michel_Renovell>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/V%E2%88%9A%E2%89%A0ctor_H._Champac>
swrc:month January (xsd:string)
swrc:number 1 (xsd:string)
swrc:pages 3:1-3:19 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/jetc/ForeroCR23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/jetc/ForeroCR23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/jetc/jetc19.html#ForeroCR23>
rdfs:seeAlso <https://doi.org/10.1145/3564244>
dc:title B-open Defect: A Novel Defect Model in FinFET Technology. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 19 (xsd:string)