[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/jetc/HuangCTK08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chen-Pang_Kung>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Huai-Yuan_Tseng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kwang-Ting_%28Tim%29_Cheng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tsung-Ching_Huang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F1389089.1389092>
foaf:homepage <https://doi.org/10.1145/1389089.1389092>
dc:identifier DBLP journals/jetc/HuangCTK08 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F1389089.1389092 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/jetc>
rdfs:label Reliability analysis for flexible electronics: Case study of integrated a-Si: H TFT scan driver. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chen-Pang_Kung>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Huai-Yuan_Tseng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kwang-Ting_%28Tim%29_Cheng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tsung-Ching_Huang>
swrc:number 3 (xsd:string)
swrc:pages 12:1-12:23 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/jetc/HuangCTK08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/jetc/HuangCTK08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/jetc/jetc4.html#HuangCTK08>
rdfs:seeAlso <https://doi.org/10.1145/1389089.1389092>
dc:subject Reliability, amorphous hydrogenated silicon (a-Si:H), flexible electronics, scan driver, thin-film transistor, threshold voltage (xsd:string)
dc:title Reliability analysis for flexible electronics: Case study of integrated a-Si: H TFT scan driver. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 4 (xsd:string)