SCT: A novel approach for testing and configuring nanoscale devices.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/jetc/RadT08
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http://dblp.uni-trier.de/rec/bibtex/journals/jetc/RadT08
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https://dblp.l3s.de/d2r/resource/authors/Mohammad_Tehranipoor
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https://dblp.l3s.de/d2r/resource/authors/Reza_M._Rad
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2008
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SCT: A novel approach for testing and configuring nanoscale devices.
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dc:
subject
Configuration and testing, crossbar, fault tolerance, nanowire, reconfigurable nanoscale devices
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dc:
title
SCT: A novel approach for testing and configuring nanoscale devices.
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