A novel method for determining machine subgroups and backups with an empirical study for semiconductor manufacturing.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/journals/jim/ChienH06
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2006
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A novel method for determining machine subgroups and backups with an empirical study for semiconductor manufacturing.
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A novel method for determining machine subgroups and backups with an empirical study for semiconductor manufacturing.
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