[RDF data]
Home | Example Publications
PropertyValue
dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/journals/jim/ChienW24>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chen_Fu_Chien_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hsin-Jung_Wu>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2Fs10845-022-02042-8>
foaf:homepage <https://doi.org/10.1007/s10845-022-02042-8>
dc:identifier DBLP journals/jim/ChienW24 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2Fs10845-022-02042-8 (xsd:string)
dcterms:issued 2024 (xsd:gYear)
swrc:journal <https://dblp.l3s.de/d2r/resource/journals/jim>
rdfs:label Integrated circuit probe card troubleshooting based on rough set theory for advanced quality control and an empirical study. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chen_Fu_Chien_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hsin-Jung_Wu>
swrc:month January (xsd:string)
swrc:number 1 (xsd:string)
swrc:pages 275-287 (xsd:string)
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/journals/jim/ChienW24/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/journals/jim/ChienW24>
rdfs:seeAlso <http://dblp.uni-trier.de/db/journals/jim/jim35.html#ChienW24>
rdfs:seeAlso <https://doi.org/10.1007/s10845-022-02042-8>
dc:title Integrated circuit probe card troubleshooting based on rough set theory for advanced quality control and an empirical study. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:Article
rdf:type foaf:Document
swrc:volume 35 (xsd:string)