Bayesian network for integrated circuit testing probe card fault diagnosis and troubleshooting to empower Industry 3.5 smart production and an empirical study. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

Property	Value
dcterms:bibliographicCitation	<http://dblp.uni-trier.de/rec/bibtex/journals/jim/FuCT22>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Chen_Fu_Chien_0001>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Lizhen_Tang>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Wenhan_Fu>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1007%2Fs10845-020-01680-0>
foaf:homepage	<https://doi.org/10.1007/s10845-020-01680-0>
dc:identifier	DBLP journals/jim/FuCT22 (xsd:string)
dc:identifier	DOI doi.org%2F10.1007%2Fs10845-020-01680-0 (xsd:string)
dcterms:issued	2022 (xsd:gYear)
swrc:journal	<https://dblp.l3s.de/d2r/resource/journals/jim>
rdfs:label	Bayesian network for integrated circuit testing probe card fault diagnosis and troubleshooting to empower Industry 3.5 smart production and an empirical study. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Chen_Fu_Chien_0001>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Lizhen_Tang>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Wenhan_Fu>
swrc:number	3 (xsd:string)
swrc:pages	785-798 (xsd:string)
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/journals/jim/FuCT22/dblp>
owl:sameAs	<http://dblp.rkbexplorer.com/id/journals/jim/FuCT22>
rdfs:seeAlso	<http://dblp.uni-trier.de/db/journals/jim/jim33.html#FuCT22>
rdfs:seeAlso	<https://doi.org/10.1007/s10845-020-01680-0>
dc:title	Bayesian network for integrated circuit testing probe card fault diagnosis and troubleshooting to empower Industry 3.5 smart production and an empirical study. (xsd:string)
dc:type	<http://purl.org/dc/dcmitype/Text>
rdf:type	swrc:Article
rdf:type	foaf:Document
swrc:volume	33 (xsd:string)