Applying the support vector machine with optimal parameter design into an automatic inspection system for classifying micro-defects on surfaces of light-emitting diode chips. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Chun-Ping_Tung>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Chung-Feng_Jeffrey_Kuo>
dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Wei-Han_Weng>
foaf:homepage	<http://dx.doi.org/doi.org%2F10.1007%2Fs10845-016-1275-1>
foaf:homepage	<https://doi.org/10.1007/s10845-016-1275-1>
dc:identifier	DBLP journals/jim/KuoTW19 (xsd:string)
dc:identifier	DOI doi.org%2F10.1007%2Fs10845-016-1275-1 (xsd:string)
dcterms:issued	2019 (xsd:gYear)
swrc:journal	<https://dblp.l3s.de/d2r/resource/journals/jim>
rdfs:label	Applying the support vector machine with optimal parameter design into an automatic inspection system for classifying micro-defects on surfaces of light-emitting diode chips. (xsd:string)
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Chun-Ping_Tung>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Chung-Feng_Jeffrey_Kuo>
foaf:maker	<https://dblp.l3s.de/d2r/resource/authors/Wei-Han_Weng>
swrc:number	2 (xsd:string)
swrc:pages	727-741 (xsd:string)
owl:sameAs	<http://bibsonomy.org/uri/bibtexkey/journals/jim/KuoTW19/dblp>
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rdfs:seeAlso	<http://dblp.uni-trier.de/db/journals/jim/jim30.html#KuoTW19>
rdfs:seeAlso	<https://doi.org/10.1007/s10845-016-1275-1>
dc:title	Applying the support vector machine with optimal parameter design into an automatic inspection system for classifying micro-defects on surfaces of light-emitting diode chips. (xsd:string)
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